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  lead-free parts pb ligitek electronics co.,ltd. property of ligitek only tower type led lamps data sheet LSR21440-PF a - 2009 22 - may. doc. no : qw0905- rev. : date : LSR21440-PF l dcc
ligitek electronics co.,ltd. property of ligitek only 1/5 2.0 2.0 2.0 1.5 max 5.4 2.5 LSR21440-PF page package dimensions part no. 2.54typ + - note : 1.all dimension are in millimeter tolerance is ?
3865 note : 1.the forward voltage data did not including ? ?
fig.3 forward voltage vs. temperature fig.5 relative intensity vs. wavelength ambient temperature(
note:1.wave solder should not be made more than one time. 2.you can just only select one of the soldering conditions as above. page 4/5 ligitek electronics co.,ltd. property of ligitek only dip soldering preheat: 120 150 time(sec) 260 260 100 120 50 preheat 0 0 25
page 5/5 ligitek electronics co.,ltd. property of ligitek only reference standard description mil-std-883:1008 jis c 7021: b-10 jis c 7021: b-12 the purpose of this is the resistance of the device which is laid under condition of low temperature for hours. the purpose of this is the resistance of the device which is laid under condition of high temperature for hours. mil-std-202:103b jis c 7021: b-11 mil-std-202: 107d mil-std-750: 1051 mil-std-883: 1011 the purpose of this test is the resistance of the device under tropical for hours. the purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. mil-std-750: 1026 mil-std-883: 1005 jis c 7021: b-1 this test is conducted for the purpose of detemining the resistance of a part in electrical and themal stressed. this test intended to see soldering well performed or not. mil-std-202: 208d mil-std-750: 2026 mil-std-883: 2003 jis c 7021: a-2 mil-std-202: 210a mil-std-750: 2031 jis c 7021: a-1 this test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire. test item reliability test: high temperature storage test low temperature storage test 1.ta=65


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